jesd22a110

JESD22-A110-B.Page1.TestMethodA110-B.(RevisionofA110-A).TESTMETHODA110-B.HIGHLY-ACCELERATEDTEMPERATURE.ANDHUMIDITYSTRESSTEST(HAST).(From ...,JEDECJESD22-A110-B-1999.A110－B高加速温度湿度压力测验的测试方法·TestMethodA110-BHighly-AcceleratedTemperatureandHumidityStressTest(HAST)·作废.,Purpose:TheJESD22-A110-Highly-AcceleratedTemperatureandHumidityStressTestisperformedforthepurposeofevaluatingthe...

參考資訊如下
EIAJEDEC STANDARD

JESD22-A110-B. Page 1. Test Method A110-B. (Revision of A110-A). TEST METHOD A110-B. HIGHLY-ACCELERATED TEMPERATURE. AND HUMIDITY STRESS TEST (HAST). (From ...

JEDEC JESD22-A110-B

JEDEC JESD22-A110-B-1999. A110－B 高加速温度湿度压力测验的测试方法 · Test Method A110-B Highly-Accelerated Temperature and Humidity Stress Test (HAST) · 作废.

JEDEC JESD22-A110: Highly

Purpose: The JESD22-A110 - Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of ...

JEDEC JESD22-A110_偏压高加速应力试验HAST

2022年4月28日 — 通用MCU AEC-Q100案例,JEDEC JESD22-A110偏压高加速应力试验HAST及JEDEC JESD22-A110无偏压高加速应力试验UHST.

JEDEC STANDARD

... JESD22-A110C and JESD22-A110-B. The following list briefly describes most of the changes made to the entries that appear in this publication,. JESD22-A110C ...

JEDEC STANDARD NO. 22

1.0 PURPOSE. The Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged ...

JEDEC半導體可靠度測試與規範

JESD22-A110E-2015有偏壓的HAST高度加速壽命試驗. 說明：依據JESD22-A110規範，THB和BHAST都是進行元器件高溫高濕的試驗，而且試驗過程需要施加偏壓，目的是加速元器件 ...

Standards & Documents Search

Paying JEDEC Members may login for free access. Current search. Search found 2 items. jesd22-a110. Search by Keyword or Document Number. or Reset. Filter by ...

可靠性与资质认证

3. 偏置的高度加速应力测试(HAST) (JESD22-A110). 目的：可模拟极端操作条件（与THB 非常相似）。 描述：在极端温度和湿度的环境下烘焙器件，时长不等。当器件在该环境 ...

温湿度偏压高加速应力实验（HAST）

参考规范：JESD22-A110. Tel：0513-69916888-8001. E-mail：[email protected]. Add：江苏省南通市如东县高新技术产业开发区金山路1号1号楼1楼. 微信公众号. 微信客服.